Investigation of SiC and C Nanostructures Obtained by MWCVD

The results of experiments on the synthesis of SiC and C nanostructures by chemical vapor deposition in microwave plasma are presented in this article. The single crystal silicon plates with orientations [100] and [111] which previously passed chemical purification were used as substrates. Also, the...

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Main Authors: B. Z. Mansurov, A. K. Kenzhegulov, B. S. Medyanova, G. Partizan, G. S. Suyundykova, B. Zhumadilov, M.E. Mansurova, U. P. Koztayeva, B. A. Aliyev
Format: Article
Language:English
Published: al-Farabi Kazakh National University 2017-06-01
Series:Eurasian Chemico-Technological Journal
Subjects:
Online Access:http://ect-journal.kz/index.php/ectj/article/view/105
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author B. Z. Mansurov
A. K. Kenzhegulov
B. S. Medyanova
G. Partizan
G. S. Suyundykova
B. Zhumadilov
M.E. Mansurova
U. P. Koztayeva
B. A. Aliyev
author_facet B. Z. Mansurov
A. K. Kenzhegulov
B. S. Medyanova
G. Partizan
G. S. Suyundykova
B. Zhumadilov
M.E. Mansurova
U. P. Koztayeva
B. A. Aliyev
author_sort B. Z. Mansurov
collection DOAJ
description The results of experiments on the synthesis of SiC and C nanostructures by chemical vapor deposition in microwave plasma are presented in this article. The single crystal silicon plates with orientations [100] and [111] which previously passed chemical purification were used as substrates. Also, the substrates of porous silicon were prepared in order to activate the surface during the synthesis. The synthesis temperature ranged from 700 to 900 °C in steps of 100 °C. The pressure in the chamber was changed depending on the power of the plasma. Studies by scanning electron microscopy (SEM) showed that formed nanostructures have a diameter of 200‒350 nm and a rough surface. The formation of nanostructures on the polished Si occurs on the SiC buffer layer. Analysis of SEM images of the samples shows that growth of NS on the surface of porous silicon is more widespread in contrast to the polished Si. The results of X-Ray spectral microanalysis showed that the carbon content in samples of nanostructures on polished Si varies from 10 to 20% and remains constant on porous silicon ~ 25%. The results of studies by Raman scattering confirmed that SiC film with structure of 3C-SiC is formed on the polished Si. Besides, the presence of main carbon peaks on both types of substrates in the range of 1338.2 and 1583 cm‒1 should be noted, which correspond to the carbon nanostructures.
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spelling doaj.art-82fb50b101214875917d50d83a72a9d82022-12-22T02:58:07Zengal-Farabi Kazakh National UniversityEurasian Chemico-Technological Journal1562-39202522-48672017-06-0119216517510.18321/ectj648105Investigation of SiC and C Nanostructures Obtained by MWCVDB. Z. Mansurov0A. K. Kenzhegulov1B. S. Medyanova2G. Partizan3G. S. Suyundykova4B. Zhumadilov5M.E. Mansurova6U. P. Koztayeva7B. A. Aliyev8Center of Innovative Technologies at the Institute of Combustion Problems, 050050, Polezhaeva st., 20, Almaty, KazakhstanCenter of Innovative Technologies at the Institute of Combustion Problems, 050050, Polezhaeva st., 20, Almaty, KazakhstanCenter of Innovative Technologies at the Institute of Combustion Problems, 050050, Polezhaeva st., 20, Almaty, Kazakhstan; al-Farabi Kazakh National University, 050040, al-Farabi ave., 71, Аlmaty, KazakhstanCenter of Innovative Technologies at the Institute of Combustion Problems, 050050, Polezhaeva st., 20, Almaty, Kazakhstan; al-Farabi Kazakh National University, 050040, al-Farabi ave., 71, Аlmaty, KazakhstanCenter of Innovative Technologies at the Institute of Combustion Problems, Polezhaeva st., 20, Almaty, Kazakhstan; Al-Farabi Kazakh National University, al-Farabi ave., 71, Аlmaty, KazakhstanCenter of Innovative Technologies at the Institute of Combustion Problems, Polezhaeva st., 20, Almaty, Kazakhstan; Al-Farabi Kazakh National University, al-Farabi ave., 71, Аlmaty, KazakhstanAl-Farabi Kazakh National University, al-Farabi ave., 71, Аlmaty, KazakhstanInstitute of Nuclear Physics, Ibragimova st., 1, Almaty, Kazakhstanal-Farabi Kazakh National University, 71 al-Farabi ave., Almaty, KazakhstanThe results of experiments on the synthesis of SiC and C nanostructures by chemical vapor deposition in microwave plasma are presented in this article. The single crystal silicon plates with orientations [100] and [111] which previously passed chemical purification were used as substrates. Also, the substrates of porous silicon were prepared in order to activate the surface during the synthesis. The synthesis temperature ranged from 700 to 900 °C in steps of 100 °C. The pressure in the chamber was changed depending on the power of the plasma. Studies by scanning electron microscopy (SEM) showed that formed nanostructures have a diameter of 200‒350 nm and a rough surface. The formation of nanostructures on the polished Si occurs on the SiC buffer layer. Analysis of SEM images of the samples shows that growth of NS on the surface of porous silicon is more widespread in contrast to the polished Si. The results of X-Ray spectral microanalysis showed that the carbon content in samples of nanostructures on polished Si varies from 10 to 20% and remains constant on porous silicon ~ 25%. The results of studies by Raman scattering confirmed that SiC film with structure of 3C-SiC is formed on the polished Si. Besides, the presence of main carbon peaks on both types of substrates in the range of 1338.2 and 1583 cm‒1 should be noted, which correspond to the carbon nanostructures.http://ect-journal.kz/index.php/ectj/article/view/105silicon carbide and carbonnanostructureschemical deposition from the gas phasemicrowave plasmaporous siliconmethod of scanning electron microscopyRaman scattering
spellingShingle B. Z. Mansurov
A. K. Kenzhegulov
B. S. Medyanova
G. Partizan
G. S. Suyundykova
B. Zhumadilov
M.E. Mansurova
U. P. Koztayeva
B. A. Aliyev
Investigation of SiC and C Nanostructures Obtained by MWCVD
Eurasian Chemico-Technological Journal
silicon carbide and carbon
nanostructures
chemical deposition from the gas phase
microwave plasma
porous silicon
method of scanning electron microscopy
Raman scattering
title Investigation of SiC and C Nanostructures Obtained by MWCVD
title_full Investigation of SiC and C Nanostructures Obtained by MWCVD
title_fullStr Investigation of SiC and C Nanostructures Obtained by MWCVD
title_full_unstemmed Investigation of SiC and C Nanostructures Obtained by MWCVD
title_short Investigation of SiC and C Nanostructures Obtained by MWCVD
title_sort investigation of sic and c nanostructures obtained by mwcvd
topic silicon carbide and carbon
nanostructures
chemical deposition from the gas phase
microwave plasma
porous silicon
method of scanning electron microscopy
Raman scattering
url http://ect-journal.kz/index.php/ectj/article/view/105
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