Free-Space Unknown Thru Measurement Using Planar Offset Short for Material Characterization
Material characterization requires the proper calibration of a material measurement system. This paper describes a free-space unknown thru measurement method using three independent planar metal offset shorts for calibrating a free-space material measurement system. This method is validated by compa...
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| Format: | Article |
| Language: | English |
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The Korean Institute of Electromagnetic Engineering and Science
2022-09-01
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| Series: | Journal of Electromagnetic Engineering and Science |
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| Online Access: | http://jees.kr/upload/pdf/jees-2022-5-r-122.pdf |