THE IDENTIFICATION ALGORITHM OF METROLOGICAL CHARACTERISTICS OF WIDE-RANGE PHOTOVOLTAIC SEMICONDUCTOR CONVERTERS WITH MULTIPLY IMPURITIES
Metrological features of photovoltaic semiconductor converters (PSC) based on semiconductors with the multiple-charge impurities are investigated in a wide range of power densities of optical radiation. The algorithm of the measurement procedure of the metrological characteristics of PSC is introduc...
| Main Authors: | , , , |
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| Format: | Article |
| Language: | English |
| Published: |
Belarusian National Technical University
2015-04-01
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| Series: | Приборы и методы измерений |
| Subjects: | |
| Online Access: | https://pimi.bntu.by/jour/article/view/146 |