Characterization of a Continuous Muon Source for the Non-Destructive and Depth-Selective Elemental Composition Analysis by Muon Induced X- and Gamma-rays

Characterization of a Continuous Muon Source for the Non-Destructive and Depth-Selective Elemental Composition Analysis by Muon Induced X- and Gamma-rays

The toolbox for material characterization has never been richer than today. Great progress with all kinds of particles and interaction methods provide access to nearly all properties of an object under study. However, a tomographic analysis of the subsurface region remains still a challenge today. I...

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Bibliographic Details
Main Authors: Sayani Biswas, Lars Gerchow, Hubertus Luetkens, Thomas Prokscha, Aldo Antognini, Niklaus Berger, Thomas Elias Cocolios, Rugard Dressler, Paul Indelicato, Klaus Jungmann, Klaus Kirch, Andreas Knecht, Angela Papa, Randolf Pohl, Maxim Pospelov, Elisa Rapisarda, Peter Reiter, Narongrit Ritjoho, Stephanie Roccia, Nathal Severijns, Alexander Skawran, Stergiani Marina Vogiatzi, Frederik Wauters, Lorenz Willmann, Alex Amato
Format: Article
Language:English
Published: MDPI AG 2022-02-01
Series:Applied Sciences
Subjects:
non-destructive technique
negative muon induced X-ray emission
continuous muon beam
sandwich sample
depth-dependent elemental analysis
Online Access:https://www.mdpi.com/2076-3417/12/5/2541

Internet

https://www.mdpi.com/2076-3417/12/5/2541

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