A Study on the Fault Location of Secondary Equipment in Smart Substation Based on the Graph Attention Network

The inability to locate device faults quickly and accurately has become prominent due to the large number of communication devices and the complex structure of secondary circuit networks in smart substations. Traditional methods are less efficient when diagnosing secondary equipment faults in smart...

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Bibliographic Details
Main Authors: Xian-Ming Xiang, Xiu-Cheng Dong, Jin-Qing He, Yong-Kang Zheng, Xin-Yang Li
Format: Article
Language:English
Published: MDPI AG 2023-11-01
Series:Sensors
Subjects:
Online Access:https://www.mdpi.com/1424-8220/23/23/9384