Effect of bias potential and dimension on electrochemical migration of capacitors for implantable devices
Abstract Dendrite formation induced by electrochemical migration (ECM) is a common reliability problem occurring on printed circuit boards (PCBs), which significantly threatens the long-term safe operations of current implantable electronic devices (IEDs). Although several factors (i.e., contaminati...
| Main Authors: | , , , , , |
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| Format: | Article |
| Language: | English |
| Published: |
Nature Portfolio
2024-03-01
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| Series: | npj Materials Degradation |
| Online Access: | https://doi.org/10.1038/s41529-024-00440-2 |