Ultralow Voltage Resistive Switching in Hafnium–Zirconium Oxide

Abstract Ultralow SET and RESET voltage are essential for high‐density, low‐power, and small heat dissipation nonvolatile random‐access memory (NVRAM) elements. A nanoscale polycrystalline Hf0.75Zr0.25O2 (HZO) thin films on Pt/Si substrate are fabricated and investigated for suitability for bipolar...

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Bibliographic Details
Main Authors: M. Asif, Rajib K. Rakshit, Ashok Kumar
Format: Article
Language:English
Published: Wiley-VCH 2024-04-01
Series:Advanced Physics Research
Subjects:
Online Access:https://doi.org/10.1002/apxr.202300123