Optical microscopy–based thickness estimation in thin GaSe flakes
We have implemented three different optical methods to quantitatively assess the thickness of thin GaSe flakes transferred on both transparent substrates, like Gel-Film, and SiO2/Si substrates. We show how their apparent color can be an efficient way to make a quick, rough estimation of the thicknes...
| Main Authors: | , , , , , |
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| Format: | Article |
| Language: | English |
| Published: |
Elsevier
2021-06-01
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| Series: | Materials Today Advances |
| Subjects: | |
| Online Access: | http://www.sciencedirect.com/science/article/pii/S2590049821000138 |