Multi-scale electron microscopy of overnitrided Sm-Fe-Mn-N powder
Multi-scale electron microscopy technique that combines transmission electron microscopy (TEM) and focused ion beam - scanning electron microscopy (FIB-SEM) was utilized to investigate the influences of the change in microstructure of Sm2(Fe0.95Mn0.05)17Nx by overnitridation on the magnetic properti...
| Main Authors: | , |
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| Format: | Article |
| Language: | English |
| Published: |
AIP Publishing LLC
2018-05-01
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| Series: | AIP Advances |
| Online Access: | http://dx.doi.org/10.1063/1.5036670 |