Geometrical Parameters of Rectangular AFM Cantilevers Producing Highest Sensitivity in Excitation of Second Mode in Air Environment
Today, improving the quality of the images acquired by the atomic force microscope (AFM) and obtaining the close properties of various samples are among the most important and challenging issues tackled by researchers. One of the key mechanisms of achieving these objectives is the excitation of high...
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| Format: | Article |
| Language: | English |
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Islamic Azad University-Isfahan (Khorasgan) Branch
2017-11-01
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| Series: | International Journal of Advanced Design and Manufacturing Technology |
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| Online Access: | https://admt.isfahan.iau.ir/article_535027_6e136d2cdf68ee386eb395cdd2f4f9c7.pdf |