Influence of Structural Defects on the Resistivity and Current Flow Field in Conductive Thin Layers
The paper presents an analysis of the influence of microcracks in textronic conductive layers on their conductive properties. The tested structures were created in the physical vacuum deposition process. The paper presents the results of computer simulations of the current flow field in thin conduct...
| Main Authors: | , , |
|---|---|
| Format: | Article |
| Language: | English |
| Published: |
MDPI AG
2020-12-01
|
| Series: | Electronics |
| Subjects: | |
| Online Access: | https://www.mdpi.com/2079-9292/9/12/2164 |