Scanning electron microscopy as a valuable tool to optimize the properties of the polymer/clay nanocomposites
AbstractThe current research utilizes a low voltage scanning electron microscopy (LV-SEM) with an electron beam along with low loading energy of lower than 2.2 KeV to minimize damage and specimen surface charging. The NovaSEM, is used as an efficient tool in the current study due to the high resolut...
| Main Authors: | , , |
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| Format: | Article |
| Language: | English |
| Published: |
Taylor & Francis Group
2023-12-01
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| Series: | Cogent Engineering |
| Subjects: | |
| Online Access: | https://www.tandfonline.com/doi/10.1080/23311916.2023.2265231 |