Room-temperature crystallization of amorphous silicon by near-UV femtosecond pulses

Near ultraviolet (λ ≈ 400 nm) femtosecond laser annealing (400 nm-FLA) in a scanning mode was employed to crystallize amorphous silicon (a-Si) films at room temperature. The average grain size of polycrystalline silicon annealed was studied as a function of the incident laser fluence and beam overla...

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Bibliographic Details
Main Authors: Ci-Ling Pan, Kuan-Wen Chen, Yi-Chao Wang, Shih-Hsuan Kao, Pohsun Wu
Format: Article
Language:English
Published: AIP Publishing LLC 2020-05-01
Series:AIP Advances
Online Access:http://dx.doi.org/10.1063/5.0001308