TFT-LCD Mura Defect Detection Using Wavelet and Cosine Transforms
Mura defects in LCM panel of TFT-LCD have the properties of local low contrast and luminance variation without a clear contour on a uniformly produced surface. This research proposes two methods which are discrete cosine transform (DCT) and discrete wavelet transform (DWT). These methods successfull...
| Main Authors: | , |
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| Format: | Article |
| Language: | English |
| Published: |
The Japan Society of Mechanical Engineers
2008-07-01
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| Series: | Journal of Advanced Mechanical Design, Systems, and Manufacturing |
| Subjects: | |
| Online Access: | https://www.jstage.jst.go.jp/article/jamdsm/2/3/2_3_441/_pdf/-char/en |