Atomic Force Microscopy Study of the Kinetic Roughening in Nanostructured Gold Films on SiO<sub>2</sub>

Atomic Force Microscopy Study of the Kinetic Roughening in Nanostructured Gold Films on SiO<sub>2</sub>

<p>Abstract</p> <p>Dynamic scaling behavior has been observed during the room-temperature growth of sputtered Au films on SiO<sub>2</sub>using the atomic force microscopy technique. By the analyses of the dependence of the roughness, &#963;, of the surface roughness...

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Bibliographic Details
Main Authors: Giannazzo F, Roccaforte F, Raineri V, Ruffino F, Grimaldi MG
Format: Article
Language:English
Published: SpringerOpen 2009-01-01
Series:Nanoscale Research Letters
Subjects:
Dynamic scaling behavior
Kinetic roughening
Atomic force microscopy
Gold
SiO<sub>2</sub>
Online Access:http://dx.doi.org/10.1007/s11671-008-9235-0

Internet

http://dx.doi.org/10.1007/s11671-008-9235-0

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