Bond wire lift-off detection by gate voltage waveform in IGBT turn-off process enhanced by digital gate control

This paper presents a new detection method of bond wire lift-off in Insulated Gate Bipolar Transistor (IGBT) power module. The bond wire lift-off is a major failure mode in power cycle degradation of the IGBT module, and many monitoring methods have been proposed and demonstrated for safety operatio...

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Bibliographic Details
Main Authors: Thatree Mamee, Zaiqi Lou, Katsuhiro Hata, Makoto Takamiya, Shin-ichi Nishizawa, Wataru Saito
Format: Article
Language:English
Published: Elsevier 2023-10-01
Series:Power Electronic Devices and Components
Subjects:
Online Access:http://www.sciencedirect.com/science/article/pii/S2772370423000202