Determination of common peak structure from multiple X-ray photo-electron spectroscopy data sets

Determination of common peak structure from multiple X-ray photo-electron spectroscopy data sets

X-ray photo-electron spectroscopy (XPS) peak structure (i.e. peak parameters and the number of peaks) offers critical insights in chemical analysis of materials. Reference XPS spectral data are available for single-phases of compounds, as cited in various research papers and databases. Herein, we co...

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Bibliographic Details
Main Authors: Ryo Murakami, Hayaru Shouno, Kenji Nagata, Hiroshi Shinotsuka, Hideki Yoshikawa
Format: Article
Language:English
Published: Taylor & Francis Group 2021-01-01
Series:Science and Technology of Advanced Materials: Methods
Subjects:
x-ray photo-electron spectroscopy
automatic peak separation of multiple-spectra
sparse-modeling
bayesian information criterion
genetic algorithm
Online Access:http://dx.doi.org/10.1080/27660400.2021.1957304

Internet

http://dx.doi.org/10.1080/27660400.2021.1957304

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