Parallel Multithread Analysis of Extremely Large Simulation Traces
With the explosion in the size of off-the-shelf integrated circuits and the advent of novel techniques related to failure modes, commercial Automatic Test Pattern Generator and fault simulation engines are often insufficient to measure the coverage of particular metrics. Consequently, a general work...
| Main Authors: | , , , , , , |
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| Format: | Article |
| Language: | English |
| Published: |
IEEE
2022-01-01
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| Series: | IEEE Access |
| Subjects: | |
| Online Access: | https://ieeexplore.ieee.org/document/9780411/ |