FABRICATION, MORPHOLOGICAL AND OPTOELECTRONIC PROPERTIES OF ANTIMONY ON POROUS SILICON AS MSM PHOTODETECTOR

<p>We report on the fabrication and characterization of MSM photodetector. We investigated the surface morphological and the structural properties of the porous silicon by optical microscopy, atomic force microscope (AFM) and X-ray diffraction. The metal–semiconductor–metal photodetector were...

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Bibliographic Details
Main Author: H. A. Hadi
Format: Article
Language:English
Published: El Oued University 2015-07-01
Series:Journal of Fundamental and Applied Sciences
Subjects:
Online Access:http://jfas.info/index.php/jfas/article/view/59