TEM Tomography of Pores with Application to Computational Nanoscale Flows in Nanoporous Silicon Nitride (NPN)

Silicon nanomembrane technologies (NPN, pnc-Si, and others) have been used commercially as electron microscopy (EM) substrates, and as filters with nanometer-resolution size cut-offs. Combined with EM, these materials provide a platform for catching or suspending nanoscale-size structures for analys...

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Main Authors: Gregory Madejski, Kilean Lucas, Flavius C. Pascut, Kevin F. Webb, James L. McGrath
格式: 文件
语言:English
出版: MDPI AG 2018-06-01
丛编:Membranes
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在线阅读:http://www.mdpi.com/2077-0375/8/2/26