Design an Identification Function to Reduce the Computational Resources on the Testing Process of an Analog Electronic Circuit
In modern electronic circuits, imperfectness in the technological process can cause errors in reaching the correct values of the functional parameters. In order to solve this problem, a novel approach of analog and mixed-signal circuit testing methodology is used. The presented approach allows the t...
| Main Authors: | , , |
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| Format: | Article |
| Language: | English |
| Published: |
Kaunas University of Technology
2019-06-01
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| Series: | Elektronika ir Elektrotechnika |
| Subjects: | |
| Online Access: | http://eejournal.ktu.lt/index.php/elt/article/view/23672 |