Characterization of thin-film adhesion and phonon lifetimes in Al/Si membranes by picosecond ultrasonics

Characterization of thin-film adhesion and phonon lifetimes in Al/Si membranes by picosecond ultrasonics

We quantitatively study interfacial adhesion in a two-layer membrane system consisting of Al and Si with femtosecond time-resolved laser spectroscopy. High-frequency acoustic pulses in the sub-THz regime are utilized to characterize the membrane system. In order to explain the distinct features of t...

Full description

Bibliographic Details
Main Authors: Martin Grossmann, Martin Schubert, Chuan He, Delia Brick, Elke Scheer, Mike Hettich, Vitalyi Gusev, Thomas Dekorsy
Format: Article
Language:English
Published: IOP Publishing 2017-01-01
Series:New Journal of Physics
Subjects:
interface adhesion
time domain spectroscopy
phonons
non-destructive testing
intrinsic damping
Online Access:https://doi.org/10.1088/1367-2630/aa6d05

Internet

https://doi.org/10.1088/1367-2630/aa6d05

Similar Items