Effects of physical and chemical surface roughness on the brightness of electron beams from photocathodes
The performance of free electron laser x-ray light sources, and systems for ultrafast electron diffraction and ultrafast electron microscopy, is limited by the brightness of the electron sources used. The intrinsic emittance, or equivalently, the mean transverse energy (MTE) of electrons emitted fro...
| Main Authors: | , , , , |
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| Format: | Article |
| Language: | English |
| Published: |
American Physical Society
2018-09-01
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| Series: | Physical Review Accelerators and Beams |
| Online Access: | http://doi.org/10.1103/PhysRevAccelBeams.21.093401 |