Neural network evaluation of geometric tip-sample effects in AFM measurements
The geometrical design of probe-tips used in atomic force microscopy (AFM) can have a significant impact on the quality of scanned measurement images which are directly related to the roughness of the sample surface being investigated. When a non-suitable probe-tip is selected to scan a given sample...
| Main Authors: | , |
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| Format: | Article |
| Language: | English |
| Published: |
Elsevier
2020-08-01
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| Series: | Micro and Nano Engineering |
| Subjects: | |
| Online Access: | http://www.sciencedirect.com/science/article/pii/S2590007220300125 |