Population-attributable risk of adverse childhood experiences for high suicide risk, psychiatric admissions, and recurrent depression, in depressed outpatients

Population-attributable risk of adverse childhood experiences for high suicide risk, psychiatric admissions, and recurrent depression, in depressed outpatients

Background: Population-attributable risk (PAR) may help estimate the potential contribution of adverse childhood experiences (ACEs) to serious clinical presentations of depression, characterized by suicidality, previous psychiatric admissions, and episode recurrence. Objective: To determine the PAR...

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Bibliographic Details
Main Authors: Sergio Gloger, Pablo Martínez, Alex Behn, M. Victoria Chacón, Marianne Cottin, Dante Diez de Medina, Paul A. Vöhringer
Format: Article
Language:English
Published: Taylor & Francis Group 2021-01-01
Series:European Journal of Psychotraumatology
Subjects:
child abuse
major depressive disorder
affective disorders
psychiatric admissions
suicidal ideation
population attributable fraction
Online Access:http://dx.doi.org/10.1080/20008198.2021.1874600

Internet

http://dx.doi.org/10.1080/20008198.2021.1874600

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