A defect detection method for topological phononic materials based on few-shot learning
Topological phononic materials have been widely used in many fields, such as topological antennas, asymmetric waveguides, and noise insulation. However, due to the limitations of the manufacturing process, topological protection is vulnerable to some severe defects that may affect the application ef...
| Main Authors: | , , , , |
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| Format: | Article |
| Language: | English |
| Published: |
IOP Publishing
2022-01-01
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| Series: | New Journal of Physics |
| Subjects: | |
| Online Access: | https://doi.org/10.1088/1367-2630/ac8307 |