A defect detection method for topological phononic materials based on few-shot learning

A defect detection method for topological phononic materials based on few-shot learning

Topological phononic materials have been widely used in many fields, such as topological antennas, asymmetric waveguides, and noise insulation. However, due to the limitations of the manufacturing process, topological protection is vulnerable to some severe defects that may affect the application ef...

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Bibliographic Details
Main Authors:	Beini Zhang, Xiao Luo, Yetao Lyu, Xiaoxiao Wu, Weijia Wen
Format:	Article
Language:	English
Published:	IOP Publishing 2022-01-01
Series:	New Journal of Physics
Subjects:	topological materials few-shot learning deep learning defect detection structure classification
Online Access:	https://doi.org/10.1088/1367-2630/ac8307

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