Measurement Techniques for Three-Dimensional Metrology of High Aspect Ratio Internal Features—A Review

Non-destructive measurements of high aspect ratio microscale features, especially those with internal geometries such as micro-holes, remain a challenging metrology problem that is increasing in difficulty due to the increasing requirement for more complexity and higher tolerances in such structures...

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Bibliographic Details
Main Authors: Tom Hovell, Jon Petzing, Wen Guo, Connor Gill, Laura Justham, Niels Lohse, Peter Kinnell
Format: Article
Language:English
Published: MDPI AG 2023-04-01
Series:Metrology
Subjects:
Online Access:https://www.mdpi.com/2673-8244/3/2/9