Multiple Soft Fault Diagnosis of Bjt Circuits

This paper deals with multiple soft fault diagnosis of nonlinear analog circuits comprising bipolar transistors characterized by the Ebers-Moll model. Resistances of the circuit and beta forward factor of a transistor are considered as potentially faulty parameters. The proposed diagnostic method ex...

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Bibliographic Details
Main Authors: Tadeusiewicz Michał, Hałgas Stanisław
Format: Article
Language:English
Published: Polish Academy of Sciences 2014-12-01
Series:Metrology and Measurement Systems
Subjects:
Online Access:http://www.degruyter.com/view/j/mms.2014.21.issue-4/mms-2014-0051/mms-2014-0051.xml?format=INT