Dark-probe scanning near-field microscopy

Dark-probe scanning near-field microscopy

Scanning near-field optical microscopy (SNOM) is a well-known powerful optical technique for visualization of surface nanostructures and fields far beyond the diffraction limit and thus indispensable in material- and nanoscience. While the SNOM resolution is theoretically unlimited, the SNOM perform...

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Bibliographic Details
Main Authors: Henrik Parsamyan, Torgom Yezekyan, Khachatur Nerkararyan, Sergey I Bozhevolnyi
Format: Article
Language:English
Published: IOP Publishing 2023-01-01
Series:New Journal of Physics
Subjects:
anapole
scanning near-field optical microscopy
core–shell
Online Access:https://doi.org/10.1088/1367-2630/acfdc5

Internet

https://doi.org/10.1088/1367-2630/acfdc5

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