Optimizing PWM Control for Efficiency and Reduction of False Turn-On Events in Synchronous Buck GaN Converters
Half-bridge GaN power converters are susceptible to false turn-on events, which can lead to shoot-through and potentially device-damaging currents. There are three main parameters that can be adjusted in PWM schemes to reduce the likelihood of false turn-on events: negative gate bias, gate resistanc...
| Main Authors: | , |
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| Format: | Article |
| Language: | English |
| Published: |
IEEE
2021-01-01
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| Series: | IEEE Access |
| Subjects: | |
| Online Access: | https://ieeexplore.ieee.org/document/9583281/ |