Improving the Precision of On-Wafer W-Band Scalar Load-Pull Measurements

Improving the Precision of On-Wafer W-Band Scalar Load-Pull Measurements

This article presents an empirical investigation of calibration effects on load-pull measurements collected on wafer and at W-band frequencies. An analysis of scattering parameter (S-parameter) measurements provides insight into how small-signal metrics germane to load pull are affected by choice of...

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Bibliographic Details
Main Authors: Nicholas C. Miller, Michael Elliott, Eythan Lam, Ryan Gilbert, Jansen Uyeda, Robert L. Coffie
Format: Article
Language:English
Published: IEEE 2023-01-01
Series:IEEE Journal of Microwaves
Subjects:
Calibration
load-pull
LRRM
measurements
scattering-parameters
TRL
Online Access:https://ieeexplore.ieee.org/document/10143346/

Internet

https://ieeexplore.ieee.org/document/10143346/

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