Contrast improvement of backscatter x-ray images by total variation method

The basis of backscatter X-ray imaging systems is the scattering of backscattered rays that have many applications in industry and inspection. In these images, organic materials with low atomic numbers, such as drugs and explosives, produce many scattered photons and are seen more clearly. These ima...

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Bibliographic Details
Main Authors: M. Azimi, E. Yahaghi, M. Roshan, E. Bayat, M. Mirzapour, A. Movafeghi, B. Rokrok
Format: Article
Language:fas
Published: Nuclear Science and Technology Research Institute 2023-03-01
Series:مجله علوم و فنون هسته‌ای
Subjects:
Online Access:https://jonsat.nstri.ir/article_1322_bf8b9689bfe0d41826a55b5995da4458.pdf