Development and Evaluation of a Leaf Disease Damage Extension in Cropsim-CERES Wheat

Development and Evaluation of a Leaf Disease Damage Extension in Cropsim-CERES Wheat

Developing disease models to simulate and analyse yield losses for various pathogens is a challenge for the crop modelling community. In this study, we developed and tested a simple method to simulate septoria tritici blotch (STB) in the Cropsim-CERES Wheat model studying the impacts of damage on wh...

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Bibliographic Details
Main Authors: Georg Röll, William D. Batchelor, Ana Carolina Castro, María Rosa Simón, Simone Graeff-Hönninger
Format: Article
Language:English
Published: MDPI AG 2019-03-01
Series:Agronomy
Subjects:
wheat
disease
yield
septoria tritici blotch
leaf area index
crop modelling
decision support system for agrotechnology transfer (DSSAT)
Cropsim-CERES Wheat
Online Access:http://www.mdpi.com/2073-4395/9/3/120

Internet

http://www.mdpi.com/2073-4395/9/3/120

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