Deep Learning Neural Network-Based Detection of Wafer Marking Character Recognition in Complex Backgrounds

Deep Learning Neural Network-Based Detection of Wafer Marking Character Recognition in Complex Backgrounds

Wafer characters are used to record the transfer of important information in industrial production and inspection. Wafer character recognition is usually used in the traditional template matching method. However, the accuracy and robustness of the template matching method for detecting complex image...

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Bibliographic Details
Main Authors: Yufan Zhao, Jun Xie, Peiyu He
Format: Article
Language:English
Published: MDPI AG 2023-10-01
Series:Electronics
Subjects:
YOLO v7-Tiny
wafer character recognition
attention mechanism
BiFPN
rotation detection
Online Access:https://www.mdpi.com/2079-9292/12/20/4293

Internet

https://www.mdpi.com/2079-9292/12/20/4293

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