Single Photon Counting Performance and Noise Analysis of CMOS SPAD-Based Image Sensors

Single Photon Counting Performance and Noise Analysis of CMOS SPAD-Based Image Sensors

SPAD-based solid state CMOS image sensors utilising analogue integrators have attained deep sub-electron read noise (DSERN) permitting single photon counting (SPC) imaging. A new method is proposed to determine the read noise in DSERN image sensors by evaluating the peak separation and width (PSW) o...

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Bibliographic Details
Main Authors: Neale A. W. Dutton, Istvan Gyongy, Luca Parmesan, Robert K. Henderson
Format: Article
Language:English
Published: MDPI AG 2016-07-01
Series:Sensors
Subjects:
single photon avalanche diode
SPAD
CMOS image sensor
CIS
single photon counting
SPC
quanta image sensor
QIS
spatio-temporal oversampling
Online Access:http://www.mdpi.com/1424-8220/16/7/1122

Internet

http://www.mdpi.com/1424-8220/16/7/1122

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