Single Photon Counting Performance and Noise Analysis of CMOS SPAD-Based Image Sensors

SPAD-based solid state CMOS image sensors utilising analogue integrators have attained deep sub-electron read noise (DSERN) permitting single photon counting (SPC) imaging. A new method is proposed to determine the read noise in DSERN image sensors by evaluating the peak separation and width (PSW) o...

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Main Authors: Neale A. W. Dutton, Istvan Gyongy, Luca Parmesan, Robert K. Henderson
Format: Article
Language:English
Published: MDPI AG 2016-07-01
Series:Sensors
Subjects:
Online Access:http://www.mdpi.com/1424-8220/16/7/1122
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author Neale A. W. Dutton
Istvan Gyongy
Luca Parmesan
Robert K. Henderson
author_facet Neale A. W. Dutton
Istvan Gyongy
Luca Parmesan
Robert K. Henderson
author_sort Neale A. W. Dutton
collection DOAJ
description SPAD-based solid state CMOS image sensors utilising analogue integrators have attained deep sub-electron read noise (DSERN) permitting single photon counting (SPC) imaging. A new method is proposed to determine the read noise in DSERN image sensors by evaluating the peak separation and width (PSW) of single photon peaks in a photon counting histogram (PCH). The technique is used to identify and analyse cumulative noise in analogue integrating SPC SPAD-based pixels. The DSERN of our SPAD image sensor is exploited to confirm recent multi-photon threshold quanta image sensor (QIS) theory. Finally, various single and multiple photon spatio-temporal oversampling techniques are reviewed.
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spelling doaj.art-8b930f137eb84c10bf0c0fed1724b6ae2022-12-22T01:57:14ZengMDPI AGSensors1424-82202016-07-01167112210.3390/s16071122s16071122Single Photon Counting Performance and Noise Analysis of CMOS SPAD-Based Image SensorsNeale A. W. Dutton0Istvan Gyongy1Luca Parmesan2Robert K. Henderson3STMicroelectronics Imaging Division, Pinkhill, Edinburgh EH12 7BF, UKCMOS Sensors and Systems Group, School of Engineering, The University of Edinburgh, Edinburgh EH9 3JL, UKCMOS Sensors and Systems Group, School of Engineering, The University of Edinburgh, Edinburgh EH9 3JL, UKCMOS Sensors and Systems Group, School of Engineering, The University of Edinburgh, Edinburgh EH9 3JL, UKSPAD-based solid state CMOS image sensors utilising analogue integrators have attained deep sub-electron read noise (DSERN) permitting single photon counting (SPC) imaging. A new method is proposed to determine the read noise in DSERN image sensors by evaluating the peak separation and width (PSW) of single photon peaks in a photon counting histogram (PCH). The technique is used to identify and analyse cumulative noise in analogue integrating SPC SPAD-based pixels. The DSERN of our SPAD image sensor is exploited to confirm recent multi-photon threshold quanta image sensor (QIS) theory. Finally, various single and multiple photon spatio-temporal oversampling techniques are reviewed.http://www.mdpi.com/1424-8220/16/7/1122single photon avalanche diodeSPADCMOS image sensorCISsingle photon countingSPCquanta image sensorQISspatio-temporal oversampling
spellingShingle Neale A. W. Dutton
Istvan Gyongy
Luca Parmesan
Robert K. Henderson
Single Photon Counting Performance and Noise Analysis of CMOS SPAD-Based Image Sensors
Sensors
single photon avalanche diode
SPAD
CMOS image sensor
CIS
single photon counting
SPC
quanta image sensor
QIS
spatio-temporal oversampling
title Single Photon Counting Performance and Noise Analysis of CMOS SPAD-Based Image Sensors
title_full Single Photon Counting Performance and Noise Analysis of CMOS SPAD-Based Image Sensors
title_fullStr Single Photon Counting Performance and Noise Analysis of CMOS SPAD-Based Image Sensors
title_full_unstemmed Single Photon Counting Performance and Noise Analysis of CMOS SPAD-Based Image Sensors
title_short Single Photon Counting Performance and Noise Analysis of CMOS SPAD-Based Image Sensors
title_sort single photon counting performance and noise analysis of cmos spad based image sensors
topic single photon avalanche diode
SPAD
CMOS image sensor
CIS
single photon counting
SPC
quanta image sensor
QIS
spatio-temporal oversampling
url http://www.mdpi.com/1424-8220/16/7/1122
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