Research on Defect Detection of Electronic Components in Facility Greenhouse Based on Improved YOLOv5

Research on Defect Detection of Electronic Components in Facility Greenhouse Based on Improved YOLOv5

To address challenges in manual detection of electronic component defects in facility greenhouses, this paper presents an electronic component defect detection method using the Improved YOLOv5 recognition algorithm. By introducing the Convolutional Block Attention Module into the YOLOv5 backbone net...

Full description

Bibliographic Details
Main Authors: Kangkang Qi, Zhen Yang, Zhichao Liang, Yangyang Fan, Hao Xu, Yundong Wu, Binbin Wang, Yongjie Cui, Shuai Wang
Format: Article
Language:English
Published: IEEE 2023-01-01
Series:IEEE Access
Subjects:
Electronic component defects
YOLOv5
attention mechanism
loss function
facility greenhouse
Online Access:https://ieeexplore.ieee.org/document/10328563/

Internet

https://ieeexplore.ieee.org/document/10328563/

Similar Items