Spin-Trapping Analysis of the Thermal Degradation Reaction of Polyamide 66

Spin-Trapping Analysis of the Thermal Degradation Reaction of Polyamide 66

The radical mechanisms of the thermal degradation of polyamide 66 (PA66) occurring under a vacuum at a temperature range between 80 °C and 240 °C (which includes the temperature of practical applications) were investigated using a spin-trapping electron spin resonance (ST-ESR) technique, as well as...

Full description

Bibliographic Details
Main Authors: Akihiro Kurima, Kenji Kinashi, Wataru Sakai, Naoto Tsutsumi
Format: Article
Language:English
Published: MDPI AG 2022-11-01
Series:Polymers
Subjects:
polyamide 6,6 (PA66)
nylon 66
thermal degradation
electron spin resonance (ESR)
spin-trapping method
radical intermediates
Online Access:https://www.mdpi.com/2073-4360/14/21/4748

Internet

https://www.mdpi.com/2073-4360/14/21/4748

Similar Items