Enhancement of InSe Field-Effect-Transistor Performance against Degradation of InSe Film in Air Environment

The degradation of InSe film and its impact on field effect transistors are investigated. After the exposure to atmospheric environment, 2D InSe flakes produce irreversible degradation that cannot be stopped by the passivation layer of h-BN, causing a rapid decrease for InSe FETs performance, which...

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Bibliografske podrobnosti
Main Authors: Yadong Zhang, Xiaoting Sun, Kunpeng Jia, Huaxiang Yin, Kun Luo, Jiahan Yu, Zhenhua Wu
Format: Article
Jezik:English
Izdano: MDPI AG 2021-12-01
Serija:Nanomaterials
Teme:
Online dostop:https://www.mdpi.com/2079-4991/11/12/3311