First non-intercepting emittance measurement by means of optical diffraction radiation interference

First non-intercepting emittance measurement by means of optical diffraction radiation interference

Transverse electron beam size measurements are required in order to determine the transverse emittance. In the case of high brightness electron beams produced by high repetition rate linear accelerators, conventional invasive diagnostics cannot sustain the intense power dissipated in intercepting de...

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Bibliographic Details
Main Authors: A Cianchi, V Balandin, M Castellano, E Chiadroni, L Catani, N Golubeva, K Honkavaara, G Kube, M Migliorati
Format: Article
Language:English
Published: IOP Publishing 2014-01-01
Series:New Journal of Physics
Subjects:
diffraction radiation
high brightness beam
emittance measurement
41.60.-m
29.27.-a
41.75.Ht
Online Access:https://doi.org/10.1088/1367-2630/16/11/113029

Internet

https://doi.org/10.1088/1367-2630/16/11/113029

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