First non-intercepting emittance measurement by means of optical diffraction radiation interference
Transverse electron beam size measurements are required in order to determine the transverse emittance. In the case of high brightness electron beams produced by high repetition rate linear accelerators, conventional invasive diagnostics cannot sustain the intense power dissipated in intercepting de...
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Format: | Article |
Language: | English |
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IOP Publishing
2014-01-01
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Series: | New Journal of Physics |
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Online Access: | https://doi.org/10.1088/1367-2630/16/11/113029 |
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author | A Cianchi V Balandin M Castellano E Chiadroni L Catani N Golubeva K Honkavaara G Kube M Migliorati |
author_facet | A Cianchi V Balandin M Castellano E Chiadroni L Catani N Golubeva K Honkavaara G Kube M Migliorati |
author_sort | A Cianchi |
collection | DOAJ |
description | Transverse electron beam size measurements are required in order to determine the transverse emittance. In the case of high brightness electron beams produced by high repetition rate linear accelerators, conventional invasive diagnostics cannot sustain the intense power dissipated in intercepting devices. The analysis of the angular distribution of diffraction radiation has been proven to be a competent candidate for non-intercepting measurements of electron beam parameters. In addition, optical diffraction radiation interference (ODRI) has been demonstrated to be superior to the single slit ODR due to its shielding capability against the synchrotron radiation background and the possibility of avoiding complementary diagnostics. This paper reports the first transverse emittance measurement ever performed with the ODRI technique. In addition, the intrinsic non-intercepting and non-disturbing feature of the ODRI method has been checked in our experimental conditions by wakefield calculations. |
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format | Article |
id | doaj.art-8c745844f9fd4151a9646362bcc783cd |
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issn | 1367-2630 |
language | English |
last_indexed | 2024-03-12T16:49:44Z |
publishDate | 2014-01-01 |
publisher | IOP Publishing |
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series | New Journal of Physics |
spelling | doaj.art-8c745844f9fd4151a9646362bcc783cd2023-08-08T11:23:45ZengIOP PublishingNew Journal of Physics1367-26302014-01-01161111302910.1088/1367-2630/16/11/113029First non-intercepting emittance measurement by means of optical diffraction radiation interferenceA Cianchi0V Balandin1M Castellano2E Chiadroni3L Catani4N Golubeva5K Honkavaara6G Kube7M Migliorati8INFN-Roma Tor Vergata & University of Rome ‘Tor Vergata’, Via della Ricerca Scientifica, 1-00133 Rome, ItalyDESY, Notkestrasse 85, 22607 Hamburg, GermanyINFN-LNF, Via E. Fermi, 40-00044 Frascati, Rome, ItalyINFN-LNF, Via E. Fermi, 40-00044 Frascati, Rome, ItalyINFN-Roma ‘Tor Vergata’, Via della Ricerca Scientifica , 1-00133 Rome, ItalyDESY, Notkestrasse 85, 22607 Hamburg, GermanyDESY, Notkestrasse 85, 22607 Hamburg, GermanyDESY, Notkestrasse 85, 22607 Hamburg, GermanyDept. SBAI, Sapienza University of Rome , Via A. Scarpa 16, 00161 Roma, ItalyTransverse electron beam size measurements are required in order to determine the transverse emittance. In the case of high brightness electron beams produced by high repetition rate linear accelerators, conventional invasive diagnostics cannot sustain the intense power dissipated in intercepting devices. The analysis of the angular distribution of diffraction radiation has been proven to be a competent candidate for non-intercepting measurements of electron beam parameters. In addition, optical diffraction radiation interference (ODRI) has been demonstrated to be superior to the single slit ODR due to its shielding capability against the synchrotron radiation background and the possibility of avoiding complementary diagnostics. This paper reports the first transverse emittance measurement ever performed with the ODRI technique. In addition, the intrinsic non-intercepting and non-disturbing feature of the ODRI method has been checked in our experimental conditions by wakefield calculations.https://doi.org/10.1088/1367-2630/16/11/113029diffraction radiationhigh brightness beamemittance measurement41.60.-m29.27.-a41.75.Ht |
spellingShingle | A Cianchi V Balandin M Castellano E Chiadroni L Catani N Golubeva K Honkavaara G Kube M Migliorati First non-intercepting emittance measurement by means of optical diffraction radiation interference New Journal of Physics diffraction radiation high brightness beam emittance measurement 41.60.-m 29.27.-a 41.75.Ht |
title | First non-intercepting emittance measurement by means of optical diffraction radiation interference |
title_full | First non-intercepting emittance measurement by means of optical diffraction radiation interference |
title_fullStr | First non-intercepting emittance measurement by means of optical diffraction radiation interference |
title_full_unstemmed | First non-intercepting emittance measurement by means of optical diffraction radiation interference |
title_short | First non-intercepting emittance measurement by means of optical diffraction radiation interference |
title_sort | first non intercepting emittance measurement by means of optical diffraction radiation interference |
topic | diffraction radiation high brightness beam emittance measurement 41.60.-m 29.27.-a 41.75.Ht |
url | https://doi.org/10.1088/1367-2630/16/11/113029 |
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