First non-intercepting emittance measurement by means of optical diffraction radiation interference
Transverse electron beam size measurements are required in order to determine the transverse emittance. In the case of high brightness electron beams produced by high repetition rate linear accelerators, conventional invasive diagnostics cannot sustain the intense power dissipated in intercepting de...
Main Authors: | A Cianchi, V Balandin, M Castellano, E Chiadroni, L Catani, N Golubeva, K Honkavaara, G Kube, M Migliorati |
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Format: | Article |
Language: | English |
Published: |
IOP Publishing
2014-01-01
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Series: | New Journal of Physics |
Subjects: | |
Online Access: | https://doi.org/10.1088/1367-2630/16/11/113029 |
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