Beyond integration: modeling every pixel to obtain better structure factors from stills

Beyond integration: modeling every pixel to obtain better structure factors from stills

Most crystallographic data processing methods use pixel integration. In serial femtosecond crystallography (SFX), the intricate interaction between the reciprocal lattice point and the Ewald sphere is integrated out by averaging symmetrically equivalent observations recorded across a large number (1...

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Bibliographic Details
Main Authors: Derek Mendez, Robert Bolotovsky, Asmit Bhowmick, Aaron S. Brewster, Jan Kern, Junko Yano, James M. Holton, Nicholas K. Sauter
Format: Article
Language:English
Published: International Union of Crystallography 2020-11-01
Series:IUCrJ
Subjects:
serial crystallography
free-electron lasers
sfx
stills
data processing
Online Access:http://scripts.iucr.org/cgi-bin/paper?S2052252520013007

Internet

http://scripts.iucr.org/cgi-bin/paper?S2052252520013007

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