Beyond integration: modeling every pixel to obtain better structure factors from stills
Most crystallographic data processing methods use pixel integration. In serial femtosecond crystallography (SFX), the intricate interaction between the reciprocal lattice point and the Ewald sphere is integrated out by averaging symmetrically equivalent observations recorded across a large number (1...
Main Authors: | Derek Mendez, Robert Bolotovsky, Asmit Bhowmick, Aaron S. Brewster, Jan Kern, Junko Yano, James M. Holton, Nicholas K. Sauter |
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Format: | Article |
Language: | English |
Published: |
International Union of Crystallography
2020-11-01
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Series: | IUCrJ |
Subjects: | |
Online Access: | http://scripts.iucr.org/cgi-bin/paper?S2052252520013007 |
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