Enhancement of the Surface Morphology of (Bi<sub>0.4</sub>Sb<sub>0.6</sub>)<sub>2</sub>Te<sub>3</sub> Thin Films by In Situ Thermal Annealing

Enhancement of the Surface Morphology of (Bi<sub>0.4</sub>Sb<sub>0.6</sub>)<sub>2</sub>Te<sub>3</sub> Thin Films by In Situ Thermal Annealing

The study of the exotic properties of the surface states of topological insulators requires defect-free and smooth surfaces. This work aims to study the enhancement of the surface morphology of optimally doped, high-crystalline (Bi<sub>0.4</sub>Sb<sub>0.6</sub>)<sub>2&l...

Full description

Bibliographic Details
Main Authors: Liesbeth Mulder, Hanne van de Glind, Alexander Brinkman, Omar Concepción
Format: Article
Language:English
Published: MDPI AG 2023-02-01
Series:Nanomaterials
Subjects:
topological insulator
smooth surfaces
molecular beam epitaxy
in situ thermal post anneal
(Bi<sub>1−x</sub>Sb<sub>x</sub>)<sub>2</sub>Te<sub>3</sub>
Online Access:https://www.mdpi.com/2079-4991/13/4/763

Internet

https://www.mdpi.com/2079-4991/13/4/763

Similar Items