Probing atomic-scale structure of dielectric ceramics with scanning transmission electron microscopy
High performance dielectric capacitors are ubiquitous components in the modern electronics industry, owing to the highest power density, fastest charge–discharge rates, and long lifetime. However, the wide application of dielectric capacitors is limited owing to the low energy density. Over the past...
| Հիմնական հեղինակներ: | , , , |
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| Ձևաչափ: | Հոդված |
| Լեզու: | English |
| Հրապարակվել է: |
World Scientific Publishing
2024-06-01
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| Շարք: | Journal of Advanced Dielectrics |
| Խորագրեր: | |
| Առցանց հասանելիություն: | https://www.worldscientific.com/doi/10.1142/S2010135X23430014 |