PREPARATION AND OPTICAL PROPERTIES OF NANOSTRUCTURED ANTIREFLECTIVE LAYERS FOR Si-PHOTODEVICES

The layers of nanoporous silicon are formed by using the method of electrochemical anodization on the surface of silicon polished wafers with the surface highly-doped n+ layer. The layers were fabricated at the constant direct current using the anodization process and at the current, which varies ac...

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Main Authors: T. I. Taubayev, V. E. Nikulin, Ye. T. Taubayev, K. K. Dikhanbayev
Format: Article
Language:English
Published: Al-Farabi Kazakh National University 2009-12-01
Series:Вестник. Серия физическая
Online Access:https://bph.kaznu.kz/index.php/zhuzhu/article/view/229
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author T. I. Taubayev
V. E. Nikulin
Ye. T. Taubayev
K. K. Dikhanbayev
author_facet T. I. Taubayev
V. E. Nikulin
Ye. T. Taubayev
K. K. Dikhanbayev
author_sort T. I. Taubayev
collection DOAJ
description The layers of nanoporous silicon are formed by using the method of electrochemical anodization on the surface of silicon polished wafers with the surface highly-doped n+ layer. The layers were fabricated at the constant direct current using the anodization process and at the current, which varies according to the certain time law. The electrochemical anodization was performed in the standard cell and by using capillary method, as well. The dependence of the spectral reflection index on various of layer preparation (current density, etching time and the time dependence of the current density) is investigated.
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spelling doaj.art-8d89d6b6fbeb4791bbbd13d6788d77852022-12-22T04:06:32ZengAl-Farabi Kazakh National UniversityВестник. Серия физическая1563-03152663-22762009-12-013147377PREPARATION AND OPTICAL PROPERTIES OF NANOSTRUCTURED ANTIREFLECTIVE LAYERS FOR Si-PHOTODEVICEST. I. Taubayev0V. E. Nikulin1Ye. T. Taubayev2K. K. Dikhanbayev3IETP, Al-Farabi Kazakh National University, Kazakhstan, AlmatyIETP, Al-Farabi Kazakh National University, Kazakhstan, AlmatyIETP, Al-Farabi Kazakh National University, Kazakhstan, AlmatyIETP, Al-Farabi Kazakh National University, Kazakhstan, AlmatyThe layers of nanoporous silicon are formed by using the method of electrochemical anodization on the surface of silicon polished wafers with the surface highly-doped n+ layer. The layers were fabricated at the constant direct current using the anodization process and at the current, which varies according to the certain time law. The electrochemical anodization was performed in the standard cell and by using capillary method, as well. The dependence of the spectral reflection index on various of layer preparation (current density, etching time and the time dependence of the current density) is investigated.https://bph.kaznu.kz/index.php/zhuzhu/article/view/229
spellingShingle T. I. Taubayev
V. E. Nikulin
Ye. T. Taubayev
K. K. Dikhanbayev
PREPARATION AND OPTICAL PROPERTIES OF NANOSTRUCTURED ANTIREFLECTIVE LAYERS FOR Si-PHOTODEVICES
Вестник. Серия физическая
title PREPARATION AND OPTICAL PROPERTIES OF NANOSTRUCTURED ANTIREFLECTIVE LAYERS FOR Si-PHOTODEVICES
title_full PREPARATION AND OPTICAL PROPERTIES OF NANOSTRUCTURED ANTIREFLECTIVE LAYERS FOR Si-PHOTODEVICES
title_fullStr PREPARATION AND OPTICAL PROPERTIES OF NANOSTRUCTURED ANTIREFLECTIVE LAYERS FOR Si-PHOTODEVICES
title_full_unstemmed PREPARATION AND OPTICAL PROPERTIES OF NANOSTRUCTURED ANTIREFLECTIVE LAYERS FOR Si-PHOTODEVICES
title_short PREPARATION AND OPTICAL PROPERTIES OF NANOSTRUCTURED ANTIREFLECTIVE LAYERS FOR Si-PHOTODEVICES
title_sort preparation and optical properties of nanostructured antireflective layers for si photodevices
url https://bph.kaznu.kz/index.php/zhuzhu/article/view/229
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AT yettaubayev preparationandopticalpropertiesofnanostructuredantireflectivelayersforsiphotodevices
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