A Novel Contrastive Self-Supervised Learning Framework for Solving Data Imbalance in Solder Joint Defect Detection

Poor chip solder joints can severely affect the quality of the finished printed circuit boards (PCBs). Due to the diversity of solder joint defects and the scarcity of anomaly data, it is a challenging task to automatically and accurately detect all types of solder joint defects in the production pr...

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Bibliographic Details
Main Authors: Jing Zhou, Guang Li, Ruifeng Wang, Ruiyang Chen, Shouhua Luo
Format: Article
Language:English
Published: MDPI AG 2023-01-01
Series:Entropy
Subjects:
Online Access:https://www.mdpi.com/1099-4300/25/2/268