Efficient machine learning-assisted failure analysis method for circuit-level defect prediction

Efficient machine learning-assisted failure analysis method for circuit-level defect prediction

Integral to the success of transistor advancements is the accurate use of failure analysis (FA) which benefits in fine-tuning and optimization of the fabrication processes. However, the chip makers face several FA challenges as device sizes, structure, and material complexities scale dramatically. T...

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Bibliographic Details
Main Author: Joydeep Ghosh
Format: Article
Language:English
Published: Elsevier 2024-06-01
Series:Machine Learning with Applications
Subjects:
Static random-access memory
SPICE simulation
Bridge defects
Variability
Random forest
t-distributed stochastic neighbor embedding
Online Access:http://www.sciencedirect.com/science/article/pii/S2666827024000136

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http://www.sciencedirect.com/science/article/pii/S2666827024000136

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